
Enhancement of radio frequency device's contact test using a novel method
Author(s) -
Hu ChengNan,
Chen WenJu,
Ko HsuanChung
Publication year - 2014
Publication title -
iet science, measurement and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.418
H-Index - 49
eISSN - 1751-8830
pISSN - 1751-8822
DOI - 10.1049/iet-smt.2013.0071
Subject(s) - radio frequency , electrical impedance , electronic engineering , electrical engineering , computer science , engineering
This investigation describes novel automatic test equipment for verifying the electric contact of radio frequency (RF) traces between RF devices by, for example, the opens and shorts test. An equivalent circuit for modelling the RF device incorporating RF traces with contact impedance is applied for theoretical analysis of the prototype design. The effectiveness of the proposed novel test methodology is then validated. The measured data from experimental testing of RF devices attained in production runs precisely address the contact issue using the novel methodology presented here.