Open AccessSpatially and spectrally resolved electroluminescence measurement system for photovoltaic characterisation
Author(s) -
Bliss Martin,
Wu Xiaofeng,
Bedrich Karl Georg,
Bowers Jake William,
Betts Thomas Richard,
Gottschalg Ralph
Publication year - 2015
Publication title -
iet renewable power generation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.005
H-Index - 76
eISSN - 1752-1424
pISSN - 1752-1416
DOI - 10.1049/iet-rpg.2014.0366
Subject(s) - electroluminescence , monochromator , photovoltaic system , amorphous silicon , radiative transfer , optics , materials science , measure (data warehouse) , optoelectronics , silicon , crystalline silicon , spontaneous emission , charge coupled device , physics , computer science , nanotechnology , electrical engineering , engineering , wavelength , laser , layer (electronics) , database
A system that combines the advantages of fast global electroluminescence (EL) imaging and detailed spectrally resolved EL measurements is presented. A charge‐coupled device camera‐based EL imaging system is used to measure the intensity of radiative recombination of the photovoltaic (PV) device spatially resolved over its full area. A monochromator‐based system is utilised to measure localised emission spectra at given points of interest. Measurements of multi‐crystalline and amorphous silicon PV devices demonstrate the potential to investigate radiative defects and reveal performance variations and non‐uniformities. This links inhomogeneities much closer to device physics than using camera‐based EL only.