Open AccessSingle chip design for detection and recovery of series LED open/short fault tolerance circuit
Author(s) -
Hsia ShihChang,
Ciou JyunJia
Publication year - 2018
Publication title -
iet power electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.637
H-Index - 77
eISSN - 1755-4543
pISSN - 1755-4535
DOI - 10.1049/iet-pel.2018.5392
Subject(s) - chip , robustness (evolution) , electrical engineering , voltage , engineering , standby power , led lamp , embedded system , electronic engineering , computer science , biochemistry , chemistry , gene
Light emitting diode (LED) lighting is widely used in current. However, lighting robustness is low in a series loop since the lighting shuts down as one LED fails. This study proposes a power chip for fault detection and isolation for enhancement of LED's fault‐withstanding capability. The chip can automatically detect the failed LEDs and bypass them, and let others continue to work. The authors implemented four bypass loops using a power metal oxide semiconductor (MOS) on the single chip. This chip can drive 1 A with 4‐bit current dimming, which includes four bypass power P‐type MOSs, one power N‐type MOS, schedule controller, level shifter and over voltage protection. The schedule controller with a state machine can quickly find which one LED fail and recover it soon. The prototyping chip was designed using TSMC 0.25 μm, which is the second generator high‐voltage technology, and the resulting chip area with pads is only 1.3 × 1.7 mm 2 . The chip had been successfully implemented and measured to drive and bypass four LED components or modules.