
Fast fault detection method for modular multilevel converter semiconductor power switches
Author(s) -
Haghnazari Saeed,
Khodabandeh Masih,
Zolghadri Mohammad Reza
Publication year - 2016
Publication title -
iet power electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.637
H-Index - 77
eISSN - 1755-4543
pISSN - 1755-4535
DOI - 10.1049/iet-pel.2015.0392
Subject(s) - modular design , control reconfiguration , fault (geology) , voltage , fault detection and isolation , electronic engineering , power (physics) , capacitor , computer science , engineering , electrical engineering , embedded system , physics , quantum mechanics , seismology , actuator , geology , operating system
This study proposes a new fault detection method for modular multilevel converter (MMC) semiconductor power switches. While in common MMCs, the cells capacitor voltages are measured directly for control purposes, in this study voltage measurement point changes to the cell output terminal improving fault diagnosis ability. Based on this measurement reconfiguration, a novel fault detection algorithm is designed for MMCs semiconductor power switches. The open circuit and short circuit faults are detected based on unconformity between modules output voltage and switching signals. Simulation and experimental results confirm accurate and fast operation of the proposed method in faulty cell diagnosis. Implementation simplicity, no need to extra voltage measurements and multi faults detection ability are some other advantages of the proposed method.