Open AccessEstimation of transient surge energy transferred with associated time delays for individual components of surge protector circuits
Author(s) -
James Sisira,
Kularatihal,
SteynRoss Alistair,
Künnemeyer Rainer
Publication year - 2015
Publication title -
iet power electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.637
H-Index - 77
eISSN - 1755-4543
pISSN - 1755-4535
DOI - 10.1049/iet-pel.2014.0212
Subject(s) - surge , transient (computer programming) , electronic circuit , energy (signal processing) , computer science , transient analysis , surge arrester , engineering , electrical engineering , transient response , physics , quantum mechanics , operating system
Modern semiconductor technology is vulnerable to transient surges such as lightning. Transient voltage suppressor systems (TVSSs), which are installed to protect modern electronics, use non‐linear components such as varistors and transient voltage suppressor diodes in their design. In the case of low‐voltage (1000 V and less) AC power circuits, there is no clear approach to estimate the energy absorption and associated time delays in individual components in relation to the propagated transient surge. Numerical simulation techniques can be used to analyse the phenomenon of surge propagation within a TVSS and estimate the energy transferred to each component with associated time delays. Suitable mathematical models must be used for the non‐linear components. This study presents the development of reasonably accurate models for the non‐linear circuit elements and formulation of state equations for the TVSS, together with simulation results; results are experimentally validated using a lightning surge simulator. The method of analysing surge propagation presented here could be extended to analyse the phenomenon of surge propagation within power conversion stages which buffer the complex electronic circuits and the power source. The results discussed here indicate that the theoretical energy calculations are within 10% of the experimental results for the individual circuit elements.