Open AccessCharacterisation of on‐chip wireless interconnects based on silicon nanoantennas via near‐field scanning optical microscopy
Author(s) -
DíazFernández Francisco J.,
Pinilla-Cienfuegos Elena,
García-Meca Carlos,
Lechago Sergio,
Griol Amadeu,
Martí Javier
Publication year - 2019
Publication title -
iet optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.379
H-Index - 42
eISSN - 1751-8776
pISSN - 1751-8768
DOI - 10.1049/iet-opt.2018.5071
Subject(s) - near field scanning optical microscope , chip , wireless , photonics , materials science , near and far field , interconnection , computer science , broadband , field (mathematics) , optical microscope , electronic engineering , nanotechnology , optoelectronics , telecommunications , engineering , optics , physics , scanning electron microscope , mathematics , pure mathematics , composite material
Recently, a novel Photonic‐Integrated Circuit (PIC) paradigm based on the use of a new kind of ultra‐directive, low‐loss, highly efficient and broadband silicon nanoantenna has enabled the first demonstration of an on‐chip wireless interconnect, with potential applications in reconfigurable networks and lab‐on‐a‐chip systems. Despite the fact that the far‐field properties of these nanoantennas have been widely studied, their near‐field behaviour stays unexplored. Here, the authors study this feature through scanning near‐field optical microscopy (SNOM). For this purpose, the authors design and characterise an on‐chip two‐port wireless link using a tailored SNOM. The conducted near‐field measurements will be useful to improve the design of these integrated photonic devices with potential impact on a variety of applications, from biosensing to optical communications.