Open AccessInfluence of adhesion layer on performance of surface plasmon resonance sensor
Author(s) -
Maurya Jitendra Bahadur,
Prajapati Yogendra Kumar
Publication year - 2018
Publication title -
iet optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.379
H-Index - 42
eISSN - 1751-8776
pISSN - 1751-8768
DOI - 10.1049/iet-opt.2018.0008
Subject(s) - prism , refractive index , surface plasmon resonance , materials science , layer (electronics) , resonance (particle physics) , molar absorptivity , optics , reflection coefficient , adhesion , reflection (computer programming) , dielectric , surface plasmon , total internal reflection , optoelectronics , plasmon , composite material , nanotechnology , atomic physics , physics , computer science , programming language , nanoparticle
The nature of dielectric constant and its thickness placed between metal layer and prism base is analysed. The attributes of reflectance curve which defines the performance of the surface plasmon resonance sensor are shift in resonance angle, minimum reflection intensity, and half width at half maxima. These attributes are plotted according to the refractive index (RI) and extinction coefficient (EC) of the adhesion layer or buffer layer placed between metal layer and prism base. Further, these attributes are plotted according to the thickness of adhesion layer at different combination of RI and EC.