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Analysis of power pattern in CLAS with the material thickness and properties error through interval arithmetic
Author(s) -
Li Peng,
Pedrycz Witold,
Xu Wanye,
Song LiWei
Publication year - 2017
Publication title -
iet microwaves, antennas and propagation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.555
H-Index - 69
eISSN - 1751-8733
pISSN - 1751-8725
DOI - 10.1049/iet-map.2016.0776
Subject(s) - interval (graph theory) , interval arithmetic , beamwidth , reliability (semiconductor) , monte carlo method , power (physics) , mathematics , algorithm , antenna (radio) , computer science , statistics , mathematical analysis , physics , telecommunications , combinatorics , quantum mechanics , bounded function
A novel analytical approach based on interval arithmetic is proposed to investigate the effect of material thickness and properties errors on the average power pattern in the conformal load‐bearing antenna structures (CLAS) for both local and global errors conditions. The uncertainties of the thickness or properties error of CLAS composite material are modelled as interval‐valued parameters. The dominant expressions between the thickness or properties error interval and the power pattern interval are derived by interval arithmetic along with some main electromagnetic characteristics (side‐lobe level, peak power, and half‐power beamwidth) expressed as intervals can be produced through interval analysis (IA). Some numerical examples are reported to validate the proposed approach and to show its reliability and efficiency when considering different thickness and property errors. The obtained results show that the proposed IA‐based approach offers tangible advantages and effectiveness against some traditional statistical techniques (such as the Monte Carlo method).

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