Open AccessRevisiting and improvement of thru‐reflect‐line calibration for accurate measurement of substrate integrated waveguide components
Author(s) -
Chen Haidong,
Che Wenquan,
Chao Yue,
Feng Wenjie,
Wu Ke
Publication year - 2017
Publication title -
iet microwaves, antennas and propagation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.555
H-Index - 69
eISSN - 1751-8733
pISSN - 1751-8725
DOI - 10.1049/iet-map.2016.0150
Subject(s) - calibration , waveguide , substrate (aquarium) , line (geometry) , electronic engineering , coaxial , electronic circuit , engineering , materials science , computer science , optoelectronics , electrical engineering , physics , mathematics , oceanography , geometry , quantum mechanics , geology
Thru‐reflect‐line (TRL) calibration method were reviewed and the related kits based on substrate integrated waveguide (SIW) were re‐examined, designed, and compared for measurements of SIW circuits. Different types of calibration kits were discussed and the design guidelines were provided. Filters working at 5 and 10 GHz were designed for the verification purpose of these calibration kits. Meanwhile, the TRL calibration method based on uniform SIW‐coaxial transitions was proposed, which shows improved measurement accuracy.