
Method to calculate the incident fields in the investigation domain in the perspective of permittivity reconstruction
Author(s) -
Mallikarjun Erramshetty,
Bhattacharya Amitabha
Publication year - 2015
Publication title -
iet microwaves, antennas and propagation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.555
H-Index - 69
eISSN - 1751-8733
pISSN - 1751-8725
DOI - 10.1049/iet-map.2013.0538
Subject(s) - permittivity , dielectric , dielectric permittivity , optics , perspective (graphical) , computational physics , physics , mathematics , geometry , optoelectronics
Permittivity of the dielectric objects is calculated using the scattered fields from objects and the incident fields in the investigation domain. In practical applications, calculation of incident fields over closely placed discrete points is a challenging task. In this study, a simple method to calculate incident fields using equivalent sources is proposed. These equivalent sources are modelled from the measured incident fields around the dielectric objects. From these sources, permittivity of the dielectric objects is calculated on experimental data set by employing contrast source inversion technique. Further, the accuracy of the proposed method is studied on synthetic data by approximating the pyramidal horn antenna fields with line and equivalent sources.