Open AccessDifferential fault analysis on LED using Super‐Sbox
Author(s) -
Zhao Guangyao,
Li Ruilin,
Cheng Lei,
Li Chao,
Sun Bing
Publication year - 2015
Publication title -
iet information security
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.308
H-Index - 34
eISSN - 1751-8717
pISSN - 1751-8709
DOI - 10.1049/iet-ifs.2013.0549
Subject(s) - block cipher , byte , key (lock) , computer science , algorithm , fault (geology) , mathematics , cryptography , computer hardware , seismology , geology , computer security
Light encryption device (LED) is a 64 bit lightweight block cipher proposed by Guo et al . at CHES 2011, and its key size is primarily defined as 64 and 128 bits. This study studies differential fault analysis (DFA) of LED using the technique of Super‐Sbox analysis. Under various fault models, the fault pattern propagation rule of the Super‐Sbox can be obtained, based on which the efficiency of fault attack on LED can be greatly improved. For LED‐64, under the nibble‐based fault model, a random nibble fault at the 30th round can reduce the size of key search space to 2 7 –2 20 (average 2 14.02 ). Even if a random nibble fault is injected into the 29th round, the size of the key search space can also be reduced to about 2 17.43 –2 17.72 (average 2 17.65 ) using early‐abort technique. Although under the byte‐based fault model, a random byte fault at the 30th round can reduce the size of the key space to 2 7 –2 16 (average 2 11.92 ). If the adversary has the capability of injecting two random nibble faults at some specified rounds, then the above fault attack on LED‐64 can be similarly extended to LED‐128, and the size of the exhaustive search space for the 128 bit key can be reduced to 2 15 –2 27.94 (average 2 21.96 ). These results demonstrate that Super‐Sbox is a powerful technique that can be used to obtain significant improvements in the key filtration, and thus improve the efficiency of DFA on some special ciphers.