Open AccessMulti‐stage risk‐based dispatch considering short‐term reliability of transmission lines
Author(s) -
Lou XianSi,
Guo ChuangXin,
Ding Yi,
Chen Wei
Publication year - 2020
Publication title -
iet generation, transmission and distribution
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.92
H-Index - 110
eISSN - 1751-8695
pISSN - 1751-8687
DOI - 10.1049/iet-gtd.2019.1866
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , electric power system , electric power transmission , mathematical optimization , contingency , economic dispatch , bilinear interpolation , term (time) , engineering , power (physics) , mathematics , linguistics , physics , philosophy , electrical engineering , quantum mechanics , computer vision
The reliability of transmission lines (TLs) has great influences on the safe operation of power systems. Random failures from TLs can be caused by multiple uncertainties such as the high load current. In this study, a multi‐stage risk‐based dispatch model is proposed to minimise the sum of generation cost and risk cost. Impacts of natural ageing, load current, health condition and disaster weather on the short‐term reliability of TLs are studied. For ensuring the operation security of power systems in the post‐contingency stage, the dynamic thermal rating (DTR) technology is implemented to improve capacities of TLs for coping with the potential overload. In order to solve this non‐linear optimiation problem caused by load current‐dependent failure probabilities and thermal rating constraints, a double‐iteration solving strategy is proposed. In exterior iterations, the sequential linear programming is applied to decouple bilinear terms of the risk cost and locally linearise failure probabilities. Meanwhile, in interior iterations, the Benders decomposition is utilised to further divide the model into the main problem and the sub‐problem for coordinating the preventive and corrective control and checking the feasibility of DTR, respectively. Proposed approaches are validated on a modified IEEE 24‐bus test system.