
Research on the deterioration process of electrical contact structure inside the ±500 kV converter transformer RIP bushings and its prediction strategy
Author(s) -
Tian Huidong,
Liu Peng,
Zhou Shiyi,
Wang Qingyu,
Wu Zehua,
Zhang Jinyin,
Peng Zongren
Publication year - 2019
Publication title -
iet generation, transmission and distribution
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.92
H-Index - 110
eISSN - 1751-8695
pISSN - 1751-8687
DOI - 10.1049/iet-gtd.2019.0110
Subject(s) - bushing , overheating (electricity) , transformer , finite element method , engineering , voltage drop , structural engineering , voltage , mechanical engineering , electrical engineering , automotive engineering , forensic engineering
Extra high‐voltage converter transformer resin impregnated paper (RIP) bushing is used as the outlet device of the converter transformer, its safe operation is directly related to the reliability of the power system. Under the long‐term effects of high current, strong mechanical stress and abrasion, the contact resistance of connection structure inside the bushing is prone to deteriorate. When the local overheating increases to a certain level, the insulation performance of bushing will decline and may lead to penetrating discharge. Therefore, it is vital to develop strategies for predicting the overheating fault of RIP bushings. In this study, firstly, one typical overheating fault of RIP bushing induced by the contact deterioration was diagnosed according to the fretting corrosive model and SF 6 decomposition process. Secondly, using the three‐dimensional electromagnetic‐thermal‐fluid finite element method, the temperature distributions of RIP bushing under the different overheating degrees were simulated. Finally, based on the maintenance experience and simulation results, the diagnosis strategies were proposed. The diagnosis principle and prediction strategies were successfully helped to maintain the faulted RIP bushings and wall bushings before a destructive overheating accident could occur, which provide a basic reference for the fault prediction and improvements of relative standards.