Open AccessIncorporating energy storage into probabilistic security‐constrained unit commitment
Author(s) -
GuerreroMestre Victoria,
Dvorkin Yury,
FernándezBlanco Ricardo,
OrtegaVazquez Miguel A.,
Contreras Javier
Publication year - 2018
Publication title -
iet generation, transmission and distribution
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.92
H-Index - 110
eISSN - 1751-8695
pISSN - 1751-8687
DOI - 10.1049/iet-gtd.2018.5413
Subject(s) - probabilistic logic , computer science , reliability engineering , procurement , contingency , power system simulation , sizing , reliability (semiconductor) , mathematical optimization , software deployment , electric power system , energy storage , economic dispatch , operations research , engineering , economics , mathematics , power (physics) , physics , quantum mechanics , artificial intelligence , art , linguistics , philosophy , management , visual arts , operating system
System operators still rely on deterministic criteria such as the N − 1 (i.e. the system would be able to withstand the outage of any single component without any load shedding) to hedge the system against contingencies. While simple and practical, this criterion miscalculates the actual amount of reserve required since it ignores the probability of contingency occurrence. Therefore, this criterion may lead to suboptimal reserve procurement and economic performance of the system. This study presents a multiperiod probabilistic security‐constrained unit commitment (UC) model that includes the probabilities of generation and transmission contingencies for optimal reserve sizing, sourcing, allocation, and timing. The ability of energy storage systems (ESS) to provide contingency reserve is explicitly modelled. Benders’ decomposition and linearisation techniques are applied to solve the proposed probabilistic UC, which would be intractable otherwise. The impact of ESS on the contingency reserve procurement and deployment in post‐contingency states are analysed on a modified version of the IEEE One‐Area Reliability Test System.