Open AccessGuest Editorial: Defect and Fault Tolerance in VLSI and NanotechnologySystems
Author(s) -
G. Chapman,
R. Thomas,
Z. Koren
Publication year - 2019
Publication title -
iet computers and digital techniques
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.219
H-Index - 46
eISSN - 1751-861X
pISSN - 1751-8601
DOI - 10.1049/iet-cdt.2019.0097
Subject(s) - very large scale integration , fault tolerance , computer science , parallel computing , computer architecture , reliability engineering , embedded system , engineering
9:45-10:25 (L)* BTI Aware Thermal Management for Reliable DVFS Designs H. Chahal, V. Tenentes, D. Rossi, and B. Al-Hashimi (U. Southampton) (S) Prognosis of NBTI Aging Using a Machine Learning Scheme N. Karimi (Rutgers U.) and K. Huang (San Diego State U.) (S) Experimental Study and Analysis of Soft and Permanent Errors in Digital Cameras I. Koren1, G. Chapman2, R. Thomas2, R. Thomas2 and Z. Koren1 (1Univ. of Massachusetts, 2Simon Fraser University)