Open AccessStudy of the monte–carlo fault injection simulator to measure a fault derating
Author(s) -
Lee DongWoo,
Na JongWhoa
Publication year - 2019
Publication title -
iet computers and digital techniques
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.219
H-Index - 46
eISSN - 1751-861X
pISSN - 1751-8601
DOI - 10.1049/iet-cdt.2018.5009
Subject(s) - derating , monte carlo method , benchmark (surveying) , fault simulator , fault injection , fault (geology) , computer science , verilog , simulation , testability , reliability engineering , embedded system , stuck at fault , fault detection and isolation , engineering , software , field programmable gate array , mathematics , statistics , electrical engineering , artificial intelligence , voltage , geography , actuator , geodesy , programming language , seismology , geology
The SER of the selected circuits can be determined via radiation tests. However, the time and costs required to perform radiation tests are prohibitive. Here, the authors introduce an accelerated Monte–Carlo fault injection (MCFI) method that can solve the slow execution time problem of the previous MCFI method using a modified simulator that uses the Verilog Procedural Interface (VPI). To demonstrate the performance of authors’ accelerated MCFI tool, the authors perform a fault‐injection campaign using the ISCAS85 and ITC99 benchmark circuits. Compared with the results from previous studies, the authors obtain an accurate logical derating rate value with a 3% variance, and the authors accelerate the execution time by 20 times or more.