Open AccessMastering CMOS variability is the key to success
Author(s) -
Asenov Asen
Publication year - 2015
Publication title -
iet computers and digital techniques
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.219
H-Index - 46
ISSN - 1751-861X
DOI - 10.1049/iet-cdt.2015.0019
Subject(s) - cmos , granularity , transistor , process variation , electronic engineering , lithography , circuit design , computer science , process (computing) , engineering , electrical engineering , materials science , optoelectronics , voltage , operating system