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Modelling for triple gate spin‐FET and design of triple gate spin‐FET‐based binary adder
Author(s) -
Malik Gul Faroz Ahmad,
Kharadi Mubashir Ahmad,
Parveen Nusrat,
Khanday Farooq Ahmad
Publication year - 2020
Publication title -
iet circuits, devices and systems
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.251
H-Index - 49
ISSN - 1751-8598
DOI - 10.1049/iet-cds.2019.0329
Subject(s) - adder , xnor gate , xor gate , serial binary adder , nand gate , cmos , logic gate , transistor , computer science , 4 bit , electronic engineering , carry save adder , electrical engineering , engineering , voltage
In this study, an InAs channel‐based triple gate spin‐field effect transistor (FET) model is proposed. The proposed triple‐gate spin‐FET offers a high density of integration, consumes low power and offers very high switching speed. By incorporating the suitable parameters like channel length, spin diffusion length, channel resistance and junction polarisation, the modelled triple gate spin‐FET is then used to implement 3‐input XOR, 3‐input XNOR and majority gate functions. The designs of 3‐input XOR and majority gates were achieved keeping in view that the sum operation of a 1‐bit full adder is obtained through XOR gate and the carry operation of 1‐bit full adder is obtained through majority gate. Therefore, for designing a 1‐bit full adder, only two spin‐FETs will be required which signifies the compact nature of the design. In addition, a 2‐bit ripple adder is designed with cascading two 1‐bit full‐adders. Finally, a comparative analysis of the proposed gates and 1‐bit full adder with the reported work and conventional CMOS design was carried out in terms of employed number of devices, power consumption and speed. The analysis shows that proposed gates/adder offer better performance than the reported work and conventional CMOS designs.

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