Open AccessTest and study on sensitivity of electronic circuit in low‐voltage release to voltage sags
Author(s) -
Ouyang Sen,
Liu Liyuan
Publication year - 2017
Publication title -
iet circuits, devices and systems
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.251
H-Index - 49
ISSN - 1751-8598
DOI - 10.1049/iet-cds.2016.0222
Subject(s) - voltage , tripping , waveform , sensitivity (control systems) , electrical engineering , low voltage , electronic circuit , voltage divider , engineering , electronic engineering , circuit breaker
This study focuses on sensitivity of electronic circuit in low‐voltage release to voltage sags based on a large‐scale test results. Although studies about ride‐through capability of some electronic devices during voltage sags have been carried out, there is few research available on sensitivity of electronic circuit in low‐voltage release to voltage sags. Operation principle and working states of electromagnetic structure are discussed. Subsequently, a detailed test scheme is proposed based on latest standards and several kinds of 220 V low‐voltage releases have been tested. Test results indicate that output waveform of electronic circuit under voltage sags can be classified into two types, which shows a clear correspondence with working state of electromagnetic structure and tripping condition of low‐voltage release. Finally, six working modes are presented to analyse the relationship between output waveform of electronic circuit and the magnitude and duration of voltage sags in details.