Open Access
Failure investigation and asset management of combined measuring instrument transformers
Author(s) -
Tee ShengJi,
Liu Qiang,
Wang Zhongdong,
Hafid Fikri,
Tournet Pierre
Publication year - 2021
Publication title -
high voltage
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.732
H-Index - 20
ISSN - 2397-7264
DOI - 10.1049/hve2.12029
Subject(s) - library science , engineering , telecommunications , computer science
Abstract Asset management of instrument transformers (ITs) has gained momentum in recent years due to their large population in the network and the potential adverse impacts of their increasing number of failures. This study investigates the failure cause of a family of combined measuring ITs via temperature profile simulations and consideration of moisture migration behaviour in an oil‐impregnated paper insulation system. The temperature difference experienced by an IT, particularly throughout summer, together with a relative saturation hysteresis phenomenon could have caused a lower dielectric strength that led to failures. The study also offers insights into factors influencing the probability of failures through analysis on the lifetime data from both graphical survival function plots and statistical Cox model. In‐service age, operating voltage level and environment appear to have an influence on failure rate.