Open AccessIn‐situ observation of electrical tree evolution in epoxy dielectrics with internal cracks
Author(s) -
Wu Zehua,
Tian Huidong,
Zhu Sijia,
Li He,
Wang Qingyu,
Xie Zongliang,
Liu Peng,
Peng Zongren
Publication year - 2021
Publication title -
high voltage
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.732
H-Index - 20
ISSN - 2397-7264
DOI - 10.1049/hve2.12028
Subject(s) - epoxy , materials science , composite material , thermosetting polymer , scanning electron microscope , electrode , tree (set theory) , chemistry , mathematical analysis , mathematics
Abstract Gas‐filled internal crack might appear in thermoset materials like epoxy resin during the equipment manufacturing, which would become a vulnerable local region to initiate the electrical tree, thus prone to cause insulation failure. The withstand voltage test was carried on epoxy samples with artificial cracks based on a rod‐plane electrode arrangement. Simultaneously, surface state variation and tree evolution with crack were observed by an optical microscope in conjunction with a charge‐coupled device camera. The changes in morphology and chemical status of the crack surface were characterized by scanning electron microscopy, laser Raman spectrometer and energy dispersive spectrometer, respectively. It was found that the erosion and tree started from the borderline of crack under a relatively low electric field strength; however, the area near the electrode had relatively little damage. The breaking of epoxy molecular chains coarsens the crack surface and further forms deep channels on a micro‐level, which is the forerunner of the electrical tree inception. Based on these, the initiation mechanisms of the crack‐induced electrical tree and the reasons for the erosion near the borderline have been revealed. This study provides a train thought for the polymer degradation opening up into the initial tree channel during tree evolution processes.