Open AccessAnalysis of alternative parameters of dynamic resistance measurement in high voltage circuit breakers
Author(s) -
Sousa Herbet Filipe,
Costa de Oliveira Adriano,
Rocha Xavier George Victor,
Nunes de Santana Henrique,
Costa Edson Guedes,
Vilela Ferreira Tarso
Publication year - 2019
Publication title -
high voltage
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.732
H-Index - 20
ISSN - 2397-7264
DOI - 10.1049/hve.2019.0046
Subject(s) - circuit breaker , degradation (telecommunications) , reliability (semiconductor) , voltage , computer science , reliability engineering , high voltage , electronic engineering , electrical engineering , engineering , telecommunications , power (physics) , physics , quantum mechanics
Throughout its lifetime, high‐voltage circuit breaker (HVCB) contacts suffer from inevitable degradation processes, especially during the formation of electric arcs. Highly degraded contacts can reduce the current interruption capacity and increase the chances of operational faults, which might lead to considerable financial losses. Therefore, the use of efficient evaluating techniques is a key factor to achieve systems reliability. The dynamic resistance measurement (DRM) is a technique that can be used to evaluate the degradation level of HVCB’ contacts. It stands out from the usual technique, static resistance measurement, by allowing the assessment of both the main contacts and the arcing contacts (ACs). Usually, the mean resistance or the area under the DRM curve is used to estimate the AC degradation. However, DRM is a non‐standardised technique and there are no specified parameters to evaluate the real wear conditions. Therefore, an analysis of alternative parameters extractible from the DRM technique is presented in this study, such as amplitude and variance of the DRM curve. The results attest the possible use of more than one parameter for the continuous evaluation of HVCB ACs, characterising the DRM as a more complete and precise diagnosis tool.