Open AccessEffects of liquids immersion and drying on the surface properties of HTV silicone rubber: characterisation by contact angle and surface physical morphology
Author(s) -
Gao Yanfeng,
Liang Xidong,
Bao Weining,
Li Shaohua,
Wu Chao,
Liu Yingyan,
Cai Yuanji
Publication year - 2019
Publication title -
high voltage
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.732
H-Index - 20
ISSN - 2397-7264
DOI - 10.1049/hve.2018.5071
Subject(s) - silicone rubber , materials science , composite material , contact angle , silicone , fractal dimension , surface roughness , immersion (mathematics) , natural rubber , surface finish , fractal , mathematics , mathematical analysis , pure mathematics
High‐temperature vulcanised (HTV) silicone rubber composite insulator has been widely used in extra‐high and ultra‐high transmission lines due to its excellent electrical and mechanical performance. In practice use, liquids may encounter the composite insulator intermittently and can lead to the degradation and deterioration of silicone rubber. In the present research, the effects of liquids immersion and subsequent drying on the surface properties of HTV silicone rubber were investigated by means of the contact angle measurement and surface physical morphology measurement which was further analysed in terms of the discrete wavelet transform method, multiresolution signal decomposition algorithm, and three‐dimensional fractal dimension calculation. Based on the experimental results, the mechanism of the loss and recovery of the hydrophobicity of HTV silicone rubber surface during the liquids immersion and subsequent drying processes were further explained by taking into consideration the embedded water molecules (and/or hydrated ions) on the HTV silicone rubber surface and the synergy of the increase in roughness/fractal dimension and low molecular weight siloxanes diffusion. This study is helpful for better understanding of the change of surface properties of HTV silicone rubber caused by environmental and electrical stresses.