Open AccessVoid discharge behaviours as a function of cavity size and voltage waveform under very low‐frequency excitation
Author(s) -
Nguyen Hong Viet Phuong,
Phung Bao Toan
Publication year - 2018
Publication title -
high voltage
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.732
H-Index - 20
ISSN - 2397-7264
DOI - 10.1049/hve.2017.0174
Subject(s) - partial discharge , very low frequency , waveform , voltage , excitation , low frequency , acoustics , void (composites) , materials science , power (physics) , physics , electrical engineering , engineering , astronomy , composite material , quantum mechanics
Measurement of partial discharge (PD) is a vital method to assess the health of the electrical insulation in high‐voltage power equipment. As diagnostic testing at very low frequency (VLF) is increasingly being used, it is important to investigate PD behaviours under such a low‐frequency voltage excitation. This study presents the PD characteristics at VLF excitation under different applied voltage waveforms, including sinusoidal and trapezoid‐based waves. Also, the effects of cavity size on PD behaviours at VLF are investigated. Experiments were performed to measure PDs in a cylindrical void bounded by solid insulation. The results show that discharge activities at VLF, in general, exhibit lower magnitude and repetition rate when compared with power frequency. Also revealed is the strong dependency of discharge parameters on the rate of voltage rise. Physical mechanisms to explain discharge behaviours are given.