
Speed‐loop frequency‐adaptive and current‐loop optimal harmonic periodic controllers for fault‐tolerant SPMSM drive systems
Author(s) -
Liu TianHua,
Mubarok Muhammad Syahril,
Hendriyono Devi
Publication year - 2021
Publication title -
iet electric power applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.815
H-Index - 97
eISSN - 1751-8679
pISSN - 1751-8660
DOI - 10.1049/elp2.12053
Subject(s) - control theory (sociology) , insulated gate bipolar transistor , controller (irrigation) , harmonic , fault (geology) , digital signal processor , engineering , transient (computer programming) , current loop , fault tolerance , open loop controller , control engineering , computer science , electronic engineering , current (fluid) , digital signal processing , control (management) , electrical engineering , voltage , closed loop , physics , biology , operating system , agronomy , reliability engineering , artificial intelligence , quantum mechanics , seismology , geology
The surface permanent magnet synchronous motor (SPMSM) drive system has been widely used in the industry due to its high power density, high efficiency and easy to control. nature The author proposes a speed‐loop frequency‐adaptive periodic controller and a current‐loop optimal harmonic periodic controller for a fault‐tolerant SPMSM drive system, including normal operating conditions and faulty operating conditions. The faulty conditions consist of an insulated gate bipolar transistor (IGBT) open‐circuit and an IGBT short‐circuit. A digital signal processor, TMS‐320F‐2808, manufactured by Texas Instruments, is used as a control centre to execute the proposed fault‐detection, fault‐diagnosis, frequency‐adaptive and optimal harmonic periodic control algorithms. Experimental results show the proposed advanced periodic controllers can provide better performance than the proportional integral controller and the classic periodic controller, including transient responses, load disturbance responses, and tracking responses under normal and faulty conditions.