Open AccessAccurate exponential histogram test method for ADC linearity test
Author(s) -
Wu Minshun,
Ban Cheng,
Guo Yi,
Xu Jiangtao,
Geng Li
Publication year - 2020
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2020.0180
Subject(s) - linearity , histogram , robustness (evolution) , mathematics , exponential function , computer science , algorithm , electronic engineering , artificial intelligence , engineering , mathematical analysis , biochemistry , chemistry , image (mathematics) , gene
An accurate exponential histogram test (EHT) method is proposed for the ADC linearity test. Different from conventional EHT methods which estimate ADC static parameters only based on the number of hits, the proposed method accurately estimates the ADC transition levels, differential non‐linearity and integral non‐linearity by creative utilisation of the information of stimulus signal. As a result, the proposed method avoids the errors introduced by the assumed proportional relationship between the code width and the number of hits in conventional methods. Simulation results show that the proposed method outperforms the conventional methods in terms of accuracy and robustness.