Open AccessSwitching converter EMI conduction modelling and verification
Author(s) -
Yin WanJun,
Ming ZhengFeng,
Wen Tao,
Wu ChangKe
Publication year - 2019
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2019.0050
Subject(s) - electromagnetic compatibility , emi , electromagnetic interference , electronic engineering , converters , electromagnetic environment , engineering , conducted electromagnetic interference , computer science , reliability engineering , electrical engineering , voltage
Switching converters are widely used. Electromagnetic compatibility (EMC) is an important index in the design process. At present, there are three problems: (i) EMC noise test is usually carried out after the prototype design is completed. This method, which is not tested at the design stage, increases the design cost to some extent; (ii) the complexity and limitations of the test environment lead to low confidence of test results; (iii) traditional modelling methods ignore many factors such as power supply feeders. To solve the above problems, an electromagnetic interference conduction model is proposed in this Letter. After experimental verification, it is found that the test results of this model have a high matching degree with the measurement results of standard EMC equipment.