Low phase noise oscillator stabilised by high quality factor AFSIW resonators | Zendy

Liu Zhiqiang | Zendy; Xu Jinping | Zendy; Wang Wenbo | Zendy

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Low phase noise oscillator stabilised by high quality factor AFSIW resonators

Author(s) -

Liu Zhiqiang,

Xu Jinping,

Wang Wenbo

Publication year - 2018

Publication title -

electronics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.375

H-Index - 146

eISSN - 1350-911X

pISSN - 0013-5194

DOI - 10.1049/el.2018.5663

Subject(s) - phase noise , resonator , q factor , quality (philosophy) , materials science , noise (video) , optoelectronics , phase (matter) , oscillator phase noise , electronic engineering , electrical engineering , acoustics , physics , computer science , noise figure , engineering , cmos , amplifier , quantum mechanics , artificial intelligence , image (mathematics)

A novel X‐band low phase noise oscillator is proposed by taking advantage of the enhanced quality factor of air‐filled substrate integrated waveguide (AFSIW) resonators. A pair of AFSIW resonators is embedded in a feedback loop, which forms a high‐selectivity bandpass filter, to greatly reduce the phase noise of a heterojunction FET oscillator. A prototype is designed, fabricated and measured. At an output signal of 9.85 GHz, the phase noise is −146.8 dBc/Hz and the figure of merit is −210.6 dBc/Hz at 1 MHz offset frequency. An improvement of about 10 dB in phase noise performance is obtained compared with published substrate integrated waveguide resonator‐based oscillators.

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