Ultrahigh‐resolution coherent optical spectrum analysis based on electrical frequency sweeping with a doubled measurement range
Author(s) -
Zhu Beibei,
Xue Min,
Pan Shilong
Publication year - 2018
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2018.1208
Subject(s) - range (aeronautics) , resolution (logic) , optics , physics , materials science , electronic engineering , optoelectronics , computer science , engineering , artificial intelligence , composite material
Based on electrical frequency sweeping, an ultrahigh‐resolution coherent optical spectrum analyser with a doubled measurement range is proposed and experimentally demonstrated. In the scheme, a frequency‐swept electrical signal is converted to the optical domain. By selecting one of the second‐order sidebands of the generated optical signal, a wavelength‐swept signal with a frequency range that is twice the bandwidths of the electro‐optic and RF components is generated. With the wavelength‐swept signal, high‐resolution optical spectrum analysis with a doubled measurement range is implemented. In a proof‐of‐concept experiment, the spectrum of a multi‐tone optical signal with a bandwidth of 20 GHz is measured with a resolution of 1.5 MHz by employing 10 GHz components.
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