Open AccessExponential‐to‐linear conversion for fluorescence lifetime measurement
Author(s) -
Punjiya M.,
Sonkusale S.
Publication year - 2018
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2018.0583
Subject(s) - exponential function , subthreshold conduction , photocurrent , voltage , mosfet , cmos , materials science , optoelectronics , excitation , exponential decay , electronic engineering , physics , electrical engineering , transistor , engineering , mathematics , mathematical analysis , nuclear physics
A new scheme for CMOS‐based fluorescence lifetime imaging with hardware‐level exponential‐to‐linear conversion is proposed. The exponential relationship between drain current and drain‐to‐source voltage in a subthreshold MOSFET is explored for linearisation of the photocurrent generated during a fluorescence decay. Simple measurement of the resulting slope, either through voltage or time measurement, provides lifetime information in a single excitation cycle. The scheme is less sensitive to time and voltage errors compared with charge modulation techniques and are suitable for applications, where high‐frame rate and rapid extraction are desired.