Open AccessMethod to reduce an unwanted EM field component in a 4‐port TEM cell
Author(s) -
Choi Sungwoong,
Jeon Sangbong,
Kim Dongho,
Park SeongOok
Publication year - 2018
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2017.4831
Subject(s) - electromagnetic compatibility , transverse plane , port (circuit theory) , electromagnetic field , electronic engineering , generator (circuit theory) , field (mathematics) , usable , optics , electrical engineering , acoustics , engineering , computer science , physics , mathematics , structural engineering , quantum mechanics , power (physics) , world wide web , pure mathematics
As an alternative standard electromagnetic (EM) field generator, a 4‐port TEM (transverse EM) cell can be used for an EM compatibility (EMC) emission and immunity test. However, unwanted EM fields generated in a TEM cell deteriorate the results and accuracy of critical EMC tests. A new method to suppress unwanted field components in a 4‐port TEM cell is proposed. To reduce the unwanted EM field, the narrow slits in internal septa are inserted, which are transverse with respect to the direction of wave propagation. By introducing the slits, the 4‐port TEM cell can provide improved standard EM field distribution with the much‐lowered unwanted field component inside the usable test volume.