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Modelling of the effective dielectric constant of planar spoof surface plasmon polariton waveguides
Author(s) -
Unutmaz M.A.,
Unlu M.
Publication year - 2017
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2017.2360
Subject(s) - surface plasmon polariton , planar , dielectric , materials science , surface plasmon , optoelectronics , propagation constant , plasmon , polariton , constant (computer programming) , optics , waveguide , permittivity , physics , computer science , computer graphics (images) , programming language
The modelling of the effective dielectric constant of a planar spoof surface plasmon polariton waveguide for X‐band frequencies is presented. The waveguide has a single conductor structure that is corrugated on both sides. A methodology to extract the effective dielectric constant of waveguides with complex patterns and a novel closed‐form formula based on complex analysis of the structure and empirical methods are suggested. The suggested formula is a function of the corrugation depth, aperture, periodicity, thickness of the substrate material and permittivity. The worst case error between the formula and measurement result is 8.4%, which is much lower than the previously reported coplanar stripline formulation approach having an error of 14.5%.

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