Open AccessMeasurement with random sampling for solving EM scattering problems over a wide angle by compressed sensing
Author(s) -
Wu Bo,
Cao Xinyuan,
Chen MingSheng
Publication year - 2017
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2017.0406
Subject(s) - compressed sensing , scattering , sampling (signal processing) , electromagnetics , process (computing) , method of moments (probability theory) , computer science , computational electromagnetics , algorithm , electronic engineering , optics , mathematics , physics , electromagnetic field , engineering , telecommunications , statistics , quantum mechanics , estimator , detector , operating system
Rapid calculation of electromagnetic (EM) scattering problems over a wide incident angle is always a difficult task for computational electromagnetics (CEMs). As a new kind of excitations which include plenty of information about incident angles was constructed, a fast method by applying compressed sensing in conjugation with traditional method of moments has been proposed. Random sampling is firstly taken into the process of linear measurement to simplify the construction of the new excitations and accelerate the recovery of unknown induced currents. The basic principle is elaborated in detail, and the effectiveness of the proposed method is validated with numerical results.