Open Accessinterview
Publication year - 2017
Publication title -
electronics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2016.4693
Subject(s) - magnetoresistive random access memory , tunnel magnetoresistance , quantum tunnelling , materials science , condensed matter physics , magnetoresistance , time dependent gate oxide breakdown , ferromagnetism , reliability (semiconductor) , dielectric strength , dielectric , engineering physics , magnetic field , optoelectronics , electrical engineering , random access memory , engineering , physics , computer science , voltage , gate dielectric , power (physics) , transistor , quantum mechanics , computer hardware
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