Open AccessFull 4‐port deembedding of differential transmission line interfaces by 2‐port reflection measurements with mode conversion excitation
Author(s) -
Ritter P.,
Möller M.
Publication year - 2017
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2016.4471
Subject(s) - reflection (computer programming) , port (circuit theory) , scattering parameters , calibration , transmission (telecommunications) , fixture , transmission line , electronic engineering , matrix (chemical analysis) , chip , mode (computer interface) , test fixture , engineering , optics , acoustics , materials science , computer science , electrical engineering , physics , mechanical engineering , quantum mechanics , composite material , programming language , operating system
An approach is presented for the determination of the 4 × 4 transmission matrix of differential transmission line interfaces on a microchip fixture. Different settings of a simple calibration structure that extends the already available 50‐Ω on‐chip termination excite different transmission modes, which are used for the determination of the transmission matrix in mixed mode parameter form. Only reflection measurements at the two easily accessible connectors of the fixture are required, which enables an in‐situ deembedding of the chip performance while mounted.