Open AccessSurface roughness characterisation using optical feedback interferometry
Author(s) -
Herbert J.,
Bertling K.,
Taimre T.,
Rakić A.D.,
Wilson S.
Publication year - 2017
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2016.4134
Subject(s) - interferometry , surface roughness , metrology , surface finish , optics , materials science , surface metrology , signal (programming language) , white light interferometry , laser , standard deviation , process (computing) , profilometer , computer science , physics , mathematics , statistics , composite material , programming language , operating system
The characterisation of surface roughness is important in process control and metrology. A simple, low cost sensor which can be used for this measurement is one based on laser optical feedback interferometry. A target containing samples of similar abrasive paper with different levels of roughness was characterised using a sensor based on this technique, and the resulting measurements show that the standard deviation of the optical feedback signal was proportional to the roughness of the surface.