Open AccessReference‐invariant permittivity and thickness measurement of lossy liquid materials
Author(s) -
Hasar U.C.,
Bute M.
Publication year - 2017
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2016.3793
Subject(s) - lossy compression , permittivity , materials science , scattering parameters , attenuation , microwave , scattering , relative permittivity , reflection (computer programming) , optics , invariant (physics) , dielectric , acoustics , mathematics , optoelectronics , physics , computer science , telecommunications , statistics , mathematical physics , programming language
A microwave method has been proposed to retrieve the complex permittivity and thickness of lossy dielectric liquids, which result in at least 10 dB attenuation, using reference‐plane‐invariant reflection scattering ( S ‐) parameters. The CST Microwave Studio simulation program was first used to validate the method. Then, the permittivity and thickness of lossy distilled water sample poured over a polyethylene sample holder were measured from reference‐invariant reflection‐only S ‐parameter measurements at the X‐band. The method was compared with other methods in the literature to analyse its accuracy.