Reference‐invariant permittivity and thickness measurement of lossy liquid materials | Zendy

Hasar U.C. | Zendy; Bute M. | Zendy

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Reference‐invariant permittivity and thickness measurement of lossy liquid materials

Author(s) -

Hasar U.C.,

Bute M.

Publication year - 2017

Publication title -

electronics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.375

H-Index - 146

eISSN - 1350-911X

pISSN - 0013-5194

DOI - 10.1049/el.2016.3793

Subject(s) - lossy compression , permittivity , materials science , scattering parameters , attenuation , microwave , scattering , relative permittivity , reflection (computer programming) , optics , invariant (physics) , dielectric , acoustics , mathematics , optoelectronics , physics , computer science , telecommunications , statistics , mathematical physics , programming language

A microwave method has been proposed to retrieve the complex permittivity and thickness of lossy dielectric liquids, which result in at least 10 dB attenuation, using reference‐plane‐invariant reflection scattering ( S ‐) parameters. The CST Microwave Studio simulation program was first used to validate the method. Then, the permittivity and thickness of lossy distilled water sample poured over a polyethylene sample holder were measured from reference‐invariant reflection‐only S ‐parameter measurements at the X‐band. The method was compared with other methods in the literature to analyse its accuracy.

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