Open AccessFixturing impacts on high‐frequency low‐resistance, low‐inductance impedance measurements
Author(s) -
Lemmon A.,
Freeborn T.J.,
Shahabi A.
Publication year - 2016
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2016.2947
Subject(s) - test fixture , inductance , fixture , electrical impedance , analyser , electronic engineering , engineering , electrical engineering , parasitic element , device under test , finite element method , acoustics , scattering parameters , materials science , mechanical engineering , structural engineering , voltage , optics , physics
Multiple off‐the‐shelf test‐fixtures are available to interface a device‐under‐test (DUT) to an impedance analyser to characterise its electrical properties. The impact of three available fixtures on the measured impedance of a low‐resistance, low‐inductance DUT requiring high‐frequency (≥100 MHz) characterisation are compared with a custom fixture. The custom fixture is shown to provide a higher accuracy than the off‐the‐shelf fixtures, highlighting that low‐resistance, low‐inductance devices require carefully constructed fixtures for characterisation. The experimental results collected using the fixtures are validated against a finite‐element‐analysis model of the DUT.