Open AccessFuzzy approach and Eddy currents NDT/NDE devices in industrial applications
Author(s) -
Versaci M.
Publication year - 2016
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2015.3409
Subject(s) - comparability , nondestructive testing , eddy current , fuzzy logic , field programmable gate array , class (philosophy) , computer science , electronic engineering , eddy current testing , engineering , artificial intelligence , electrical engineering , mathematics , computer hardware , physics , quantum mechanics , combinatorics
In this Letter, detection/classification of defects are treated in a fuzzy way considering classes of defects to a certain depth characterized by typical ranges of fuzzy similarities. So, depth evaluation is translated in terms of comparison of similarities among signals with defectiveness located at unknown depth and the class of signals without defects. In addition, an FPGA‐based board implementing the designed procedure will be discussed. The performance gives the comparability of the results with other established techniques.