Open AccessSimple non‐impedance‐based measuring technique for supercapacitors
Author(s) -
Tsirimokou G.,
Psychalinos C.,
Allagui A.,
Elwakil A.S.
Publication year - 2015
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2015.2395
Subject(s) - supercapacitor , capacitance , electrical impedance , electronic engineering , dielectric spectroscopy , simple (philosophy) , amplifier , materials science , electrical engineering , computer science , engineering , electrochemistry , electrode , physics , cmos , philosophy , epistemology , quantum mechanics
It is shown that the electric characterisation of supercapacitors cannot simply be performed by standard LCR meters, as these devices do not account for the fractional capacitance behaviour. The accurate modelling of their frequency‐dependent impedance requires direct impedance measurement using electrochemical impedance spectroscopy. A very simple and cost‐effective alternative using a single operational amplifier‐based circuit to extract the parameters of a supercapacitor without requiring the use of an expensive electrochemical station or a post‐processing data fitting algorithm is presented.