Open AccessVery low thermal drift precision virtual voltage reference
Author(s) -
Crovetti P.S.
Publication year - 2015
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2015.1209
Subject(s) - microcontroller , voltage , thermal , voltage reference , cmos , computer science , electronic engineering , thermal state , electrical engineering , materials science , engineering , physics , meteorology
A digital‐based, process‐supply‐and‐temperature independent voltage reference suitable to nanoscale CMOS technologies, which exploits the recently proposed ‘virtual reference’ concept to achieve a very low thermal drift, is presented. Its performance is assessed on the basis of simulations and experiments carried out on a microcontroller‐based, proof‐of‐concept prototype and is compared with state‐of‐the‐art integrated analogue and digital voltage references. A simulated (measured) thermal drift as low as 1 ppm/°C (5 ppm/°C) in the temperature range −40/+140°C ( − 10/+100°C) is reported.