Digitally tuned degeneration resistance to improve linearity of boost factors for analogue equalisers | Zendy

Wang Zinan | Zendy; Gai Weixin | Zendy

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Digitally tuned degeneration resistance to improve linearity of boost factors for analogue equalisers

Author(s) -

Wang Zinan,

Gai Weixin

Publication year - 2015

Publication title -

electronics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.375

H-Index - 146

ISSN - 1350-911X

DOI - 10.1049/el.2015.0461

Subject(s) - equaliser , degeneration (medical) , linearity , cmos , electronic engineering , variable (mathematics) , engineering , electrical engineering , mathematics , medicine , mathematical analysis , channel (broadcasting) , pathology

An analogue equaliser with a novel digitally tuned variable degeneration resistance is realised in a 65 nm CMOS technology. Implemented with three parallel resistance branches and one serial resistance branch to well fit the optimal conductance curve, the proposed variable degeneration resistance is exploited to achieve a wide boost range while significantly improving the linearity of the tuned boost factors compared with the equaliser with a traditional degeneration resistance structure.

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