Open AccessDigitally tuned degeneration resistance to improve linearity of boost factors for analogue equalisers
Author(s) -
Wang Zinan,
Gai Weixin
Publication year - 2015
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2015.0461
Subject(s) - equaliser , degeneration (medical) , linearity , cmos , variable (mathematics) , electronic engineering , control theory (sociology) , engineering , computer science , mathematics , electrical engineering , artificial intelligence , medicine , mathematical analysis , channel (broadcasting) , control (management) , pathology
An analogue equaliser with a novel digitally tuned variable degeneration resistance is realised in a 65 nm CMOS technology. Implemented with three parallel resistance branches and one serial resistance branch to well fit the optimal conductance curve, the proposed variable degeneration resistance is exploited to achieve a wide boost range while significantly improving the linearity of the tuned boost factors compared with the equaliser with a traditional degeneration resistance structure.