Open AccessEmbedded high‐precision capacitor measurement system based on ring‐oscillator
Author(s) -
Welter L.,
Dreux P.,
Aziza H.,
Portal J.M.
Publication year - 2015
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2014.4373
Subject(s) - capacitor , ring oscillator , robustness (evolution) , electronic engineering , measure (data warehouse) , system of measurement , noise immunity , decoupling capacitor , electrical engineering , calibration , computer science , engineering , electronic circuit , physics , voltage , biochemistry , chemistry , quantum mechanics , database , astronomy , gene
A direct way to measure the electrical value of capacitors embedded in a circuit using a ring‐oscillator is presented. A calibration system ensures the robustness of the measurement process against temperature, power supply and process variations. Silicon results show the ability of the system to measure robustly a large range of small capacitors. The system also provides a noise immunity as the system provides a digital signature of the capacitor value.