Embedded high‐precision capacitor measurement system based on ring‐oscillator | Zendy

Welter L. | Zendy; Dreux P. | Zendy; Aziza H. | Zendy; Portal J.M. | Zendy

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Embedded high‐precision capacitor measurement system based on ring‐oscillator

Author(s) -

Welter L.,

Dreux P.,

Aziza H.,

Portal J.M.

Publication year - 2015

Publication title -

electronics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.375

H-Index - 146

eISSN - 1350-911X

pISSN - 0013-5194

DOI - 10.1049/el.2014.4373

Subject(s) - ring oscillator , capacitor , ring (chemistry) , electronic engineering , electrical engineering , materials science , computer science , optoelectronics , engineering , voltage , chemistry , organic chemistry

A direct way to measure the electrical value of capacitors embedded in a circuit using a ring‐oscillator is presented. A calibration system ensures the robustness of the measurement process against temperature, power supply and process variations. Silicon results show the ability of the system to measure robustly a large range of small capacitors. The system also provides a noise immunity as the system provides a digital signature of the capacitor value.

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