3D imaging with single‐plane electrical capacitance tomography sensor | Zendy

Sun Jiangtao | Zendy; Ren Zhen | Zendy; Yang Wuqiang | Zendy

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3D imaging with single‐plane electrical capacitance tomography sensor

Author(s) -

Sun Jiangtao,

Ren Zhen,

Yang Wuqiang

Publication year - 2015

Publication title -

electronics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.375

H-Index - 146

eISSN - 1350-911X

pISSN - 0013-5194

DOI - 10.1049/el.2014.3667

Subject(s) - electrical capacitance tomography , capacitance , tomography , materials science , electrical resistivity tomography , plane (geometry) , electrical engineering , optoelectronics , optics , physics , engineering , electrical resistivity and conductivity , electrode , geometry , mathematics , quantum mechanics

A single‐plane electrical capacitance tomography (ECT) sensor is usually used to visualise dielectric material distribution by providing two‐dimensional (2D) images. The imaging of a metallic object inside a dielectric material is reported and the feasibility of 3D imaging based on the fringe effect of a single‐plane ECT sensor is demonstrated. Experimental results are given.

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