Open AccessReflection phase of electromagnetic bandgap structure measurement based on parallel‐plate waveguide system
Author(s) -
Su ZiJian,
Dang XiaoJie,
Li Long,
Liang ChangHong
Publication year - 2015
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2014.2990
Subject(s) - reflection (computer programming) , optics , waveguide , phase (matter) , phase difference , materials science , band gap , reflection coefficient , electromagnetic radiation , optoelectronics , physics , computer science , quantum mechanics , programming language
A carefully designed parallel‐plate waveguide measurement system is constructed to measure the reflection phase of a compact electromagnetic bandgap (EBG) structure. A quasi‐plane wave is created in the parallel‐plate waveguide chamber, which is the basic condition of phase measurement. Two EBG samples with different parameters are measured in this system. The data of the two samples agree well with those of infinite array EBG mode simulations, which proves that this measurement method has good accuracy and reliability. This system reduces the cost of EBG reflection phase measurement and the samples used in the experiment have a much smaller size.