Open AccessImpact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices
Author(s) -
Ioannidis E.G.,
Theodorou C.G.,
Haendler S.,
Dimitriadis C.A.,
Ghibaudo G.
Publication year - 2014
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2014.1837
Subject(s) - cmos , noise (video) , infrasound , monte carlo method , statistics , standard deviation , dispersion (optics) , statistical parameter , electronic engineering , mathematics , statistical physics , algorithm , computational physics , computer science , physics , engineering , acoustics , artificial intelligence , optics , image (mathematics)
The impact on the extracted low‐frequency noise (LFN) parameter values due to LFN variability in CMOS devices is investigated. First, it is demonstrated that the noise level dispersion follows a log normal statistical distribution. Then, based on this feature, it is explained why the mean values from the linear data are different from the mean values (or median values) calculated from the log noise data. Finally, the consequence of this finding in terms of LFN characterisation issues and Monte Carlo LFN variability circuit simulation is discussed.