Open AccessEvaluation of RF micro‐discharge regimes in performance of evanescent‐mode cavity resonators
Author(s) -
Semnani A.,
Peroulis D.
Publication year - 2014
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2014.1790
Subject(s) - resonator , materials science , radio frequency , mode (computer interface) , optics , acoustics , optoelectronics , electronic engineering , electrical engineering , physics , engineering , computer science , operating system
RF gas breakdown in small gaps is a primary limiting factor in the power handling of heavily loaded cavity‐based resonators. The effects of different RF micro‐discharge regimes in the performance of these resonators are studied. Specifically, two resonators at 1 and 50 GHz with the same critical gap size of 19 μm which are, respectively, working in the RF boundary and diffusion‐controlled regimes are considered. By combining plasma and electromagnetic simulations, the effects of high power gas breakdown in the performance of these resonators are compared. A sensitivity analysis on the effects of microscopic plasma parameters is also performed.