Improving fast S ‐parameter convolution by optimising reference impedance
Author(s) -
Goh P.,
SchuttAiné J.E.
Publication year - 2014
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2014.1498
Subject(s) - convolution (computer science) , electrical impedance , computer science , electronic engineering , mathematics , algorithm , electrical engineering , engineering , artificial intelligence , artificial neural network
A method to perform fast transient simulations of interconnects by modelling the impulse responses of the S ‐parameters as discrete impulses, and then retaining only those with significant magnitudes has recently been shown to be faster than the present state‐of‐the‐art method of curve fitting to a rational function model. An improvement to the fast convolution method by first optimising the choice of reference impedance used in the dataset is proposed. The method is seen to yield computational savings while retaining the accuracy.
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