Open AccessSub‐THz characterisation of multi‐walled carbon nanotube thin films using vector network analyser
Author(s) -
Puthukodan S.,
Dadrasnia E.,
Vinod V.K.T.,
Nguendon H.K.,
Lamela H.,
Ducournau G.,
Lampin J.F.,
Garet F.,
Coutaz J.L.,
Lee D.M.,
Baik S.
Publication year - 2014
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2013.4136
Subject(s) - terahertz radiation , carbon nanotube , materials science , permittivity , thin film , conductivity , refractive index , analyser , optoelectronics , substrate (aquarium) , optics , dielectric , nanotechnology , physics , oceanography , quantum mechanics , geology
A vector network analyser is used to study the electrical properties of multi‐walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub‐terahertz (THz) frequency ranges of 220–325 GHz (WR3.4) and 325–500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson‐Ross‐Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time‐domain spectroscopy.