Open AccessExperimental characterisations of thin film transmission line losses
Author(s) -
Kim D.,
Kim H.,
Eo Y.
Publication year - 2013
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2013.1444
Subject(s) - materials science , transmission line , optoelectronics , thin film , line (geometry) , electrical engineering , electronic engineering , engineering , nanotechnology , mathematics , geometry
New frequency‐variant losses of planar thin film transmission lines are experimentally investigated in a broad frequency range. The frequency‐variant transmission line parameters are accurately determined in the measured frequency band (i.e. from 40 MHz to 50 GHz). Then, it is shown that there are three critical frequencies that characterise the loss mechanism of thin film transmission lines. The conventional skin‐effect model is not accurate in thin and fine transmission lines.